| Company |
Website |
Software |
|
Bede Scientific, Inc.
UK |
www.bede.co.uk |
Bede Control-
Diffractometer control, data acquisition.
Bede
Search/Match -Novel high-speed data correlation
algorithm, Residual search/match for minor phases
Bede Refs 4.0
-Automated sample characterization, determination of structural
parameters
Bede Contour-
Reciprocal space and texture maps |
|
Bruker AXS GmbH
Germany
Bruker AXS
USA
|
www.bruker-axs.de
www.bruker-axs.com |
BASIC Measurement Package
Instrument control and data acquisition
EVA
Qualitative and semi-quantitative phase analysis
SEARCH
Phase identification
TOPAS
Profile analysis, quantitative analysis, structure analysis
Texture, ODF, Multex, Multex AREA
Texture analysis of 1- and 2-dimensional datasets
STRESS
Residual stress investigation
LEPTOS
Thin film analysis
GADDS
Area Detector frame buffer software for data collection, display and data
processing
SNAP-1D
Pattern matching for high-throughput data analysis
SAXS
Small angle X-ray scattering investigations |
GBC Scientific Equipment
Pty. Ltd.
Australia |
www.gbcsci.com |
Traces v.6
Features: multiple data formats, background
treatment, K alpha two removal, search-match with PDF-n, indexing (?),
unit cell simulation etc. |
INEL Instrumentation Electronique
France
|
www.inel.fr |
http://www.inel.fr/images/lgcis_us.gif
|
|
Ital Structures S.r.l. -
Italy |
www.italstructures.com |
Offers
a large variety of acquisition programs, for standard as well as for
custom hardware configurations. All programs run on Windows®. The list
includes the programs for powder and high resolution diffractometers, data
acquisition, retained austenite, textures and Rietveld analysis
WinDust32 -General purpose powder diffraction software
Winstress32 - Residual stress software
Winsearch32 - Search-Match software
IS-MAUD - Rietveld
Analysis software |
|
Kratos Analytical a Shimadzu group company |
www.kratos.com |
|
Materials Data, Inc.
USA
|
www.materialsdata.com |
JADE v7.0
Advanced powder data processing
Datascan v.4.0
XRD
control and acqusition
Riqas
Rietveld analysis
Powder
Pattern and structure simulation |
OMNI Scientific
Instruments, Inc.
USA
|
www.omniinstruments.com |
TXRDWIN 5.0
Controls x-ray
diffractometers and performs analysis of the results. Plug-in modules
support pattern conditioning, PDF-2 search/match, quantitative analysis,
etc. |
Panalytical B.V.
The Netherlands
|
www.panalytical.com |
X'Pert Data
Collector
X'Pert
Industry
X'Pert
Quantify
X'Pert
HighScore
X'Pert
HighScore Plus
X'Pert Stress
X'Pert
Texture
Line Profile
Analysis
X'Pert
Epitaxy
Smoothfit
X'Pert
Reflectivity
ProFit
|
Rigaku Corporation
Japan
Rigaku MSC
USA
|
www.rigaku.co.jp
www.RigakuMSC.com |
|
|
STOE & Cie GmbH
Germany
|
www.stoe.com |
Win XPOW
package
Win XPOW Search/Match (optional)
LAYER reflectometry evaluation and simulation package |
