Advanced Powder Diffraction Courses
XRD.US is offering the following advanced powder diffraction courses:
Rietveld structure refinement, Ab initio structure determination with
powder diffraction data and Quantitative phase analysis by Rietveld
method. These courses are designed for scientific and
technical professionals from academy and industry. Only
introductory level of familiarity with powder diffraction is required to
take full advantage of these courses material.
Advanced concepts and computational methods of crystallography and of powder
diffraction are introduced, explained with examples from materials
science, mineralogy, soil science, environmental and other areas.
Important feature of these courses is the manner in which both
concentrated theory and practice methods are delivered in favor of over-complicating
or
over-simplifying approach.
Rietveld Structure
Refinement
The course objective is to give a crystallographic
and mathematical background of Rietveld method and hands-on
knowledge of modern Rietveld structure refinement software packages.
Lectures covering the basics of crystallography, powder diffraction, least
square method will be followed by practical sessions devoted to refinement
of various easy and challenging structures....read
more
Quantitative Phase Analysis by Rietveld Method
The course will consist of two
components, the theory of Rietveld phase quantification method and the practical application
and use of software packages for Rietveld quantitative analysis. All
participants will be supplied with notebook computers with installed
necessary software, database, and x-ray diffraction data files of samples
of various origins for quantification and tools for learning. The course
consists of series of lectures and exercises followed by practical
sessions on PCs. Vendors’ representatives will present modern phase
quantification software....read more
Ab initio Structure Determination with Powder
Diffraction Data
Ab initio
crystal
structure determination with powder diffraction data is not a
straightforward process because of the accuracy in integrated intensity
that is due to the peaks overlapping, preferred orientation and other
factors. The course objective is to give a crystallographic and
mathematical background of common ab initio approaches and
hands-on knowledge of modern diffraction data reduction and structure solution and
refinement software packages for academia, government and industry
professionals....read more |
